Advances in X-Ray Analysis Vol. 35

Authors: C.S. Barrett, John V. Gilfrich, Ting C. Huang, Ron Jenkins
Publisher: Springer
Edition: 1
Publish Year: 1992
ISBN: 0306442493

The proceedings of the combined First Pacific-International Congress on X-Ray Analytical Methods (PICXAM) and Fortieth Annual Conference on Applications of X-Ray Analysis, held in Hilo and Honolulu Hawaii, August 1991, comprise reports on the latest developments in international research on X-ray fluorescence and X-ray diffraction techniques. For scientists and technicians in materials science, applied spectroscopy, instrumentation, and all aspects of X-ray techniques