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Frontiers of Characterization and Metrology for Nanoelectronics: 2007 International Conference on Frontiers of Characterization and Metrology

Frontiers of Characterization and Metrology for Nanoelectronics: 2007 International Conference on Frontiers of Characterization and Metrology

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Authors: David G. Seiler, Alain C. Diebold, Robert Mcdonald, C. Michael Garner, Dan Herr, Rajinder P. K Publisher: American Institute of Physics Edition: 1 Publish Year: 2007 ISBN: 9780735404410 As the semiconductor industry continues to move toward silicon nanoelectronics and beyond, the introduction of new materials, innovative processing and assembly, and novel devices brings formidable metrology challenges. This book emphasizes the frontiers of innovation in the characterization and metrology needed to advance nanoelectronics.

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